Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/23079
DC 欄位值語言
dc.contributor.authorMing-Wei Chenen_US
dc.contributor.authorCheng-Ying Chenen_US
dc.contributor.authorHau Heen_US
dc.date.accessioned2022-11-14T01:17:01Z-
dc.date.available2022-11-14T01:17:01Z-
dc.date.issued2010-01-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/23079-
dc.description03-08 January 2010 Hong Kongen_US
dc.description.abstractA single ZnO nanowire (NW) photodetector was fabricated and measured under different excitation intensities. The photoconductive internal gain was decreased as the excitation intensity was increased, indicating the hole-trapping photoconduction mechanism of ZnO NWs. As Au nanoparticles are decorated at the surface of a ZnO NW, the local space charge region is formed due to the existence of Schottky junction. This enhancement of the surface electric field results in more pronounced electron-hole separation effect, which then prolongs the lifetime of photogenerated electron and consequently increases the photocurrent. This study provides an easy way to enhance the sensitivity of photodetectors.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.ispartof2010 3rd International Nanoelectronics Conference (INEC)en_US
dc.subjectPhotoconductivityen_US
dc.subjectGolden_US
dc.subjectZinc oxideen_US
dc.subjectPhotodetectorsen_US
dc.subjectPhotonicsen_US
dc.subjectSpace chargeen_US
dc.subjectHeliumen_US
dc.subjectNanoparticlesen_US
dc.subjectElectron trapsen_US
dc.subjectSchottky barriersen_US
dc.titlePhotoconductive enhancement of Au nanoparticles-decorated single ZnO nanowire photodetector through formation of local schottky junctionen_US
dc.typeconference paperen_US
dc.relation.conferenceNanoelectronics Conference (INEC), 2010 3rd Internationalen_US
dc.identifier.doi10.1109/INEC.2010.5424964-
dc.relation.pages1181-1182en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypeconference paper-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Engineering-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
顯示於:光電與材料科技學系
顯示文件簡單紀錄

Page view(s)

117
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋