|Title:||An efficient method for solving electrostatic problems||Authors:||Shiong-Woei Chyuan
|Keywords:||Integral equations;Boundary element methods;Sparse matrices;Symmetric matrices;Electrostatic analysis;Boundary value problems;Electrons;Microelectromechanical systems;Micromechanical devices;Lead||Issue Date:||May-2003||Publisher:||Institute of Electrical and Electronics Engineers||Journal Volume:||5||Journal Issue:||3||Start page/Pages:||52-58||Source:||Computing in Science & Engineering||Abstract:||
Electrostatic problems are those that deal with the effects of electric charges at rest. For modern electron and microelectromechanical systems (MEMS), an accurate electrostatic analysis is both essential and indispensable. We know that if we use the conventional boundary element method for electrostatic problems that have singularity due to degenerate boundaries, the coincidence of the boundaries gives rise to a difficult, or ill-conditioned, problem. The coincidence is when different elements use the same nodes, but there is a free-edge between the elements. The dual boundary element method (DBEM) provides fast, accurate, and efficient solutions. We compare results between finite element method (FEM) and DBEM analyses to prove DBEM's superiority. Because model creation requires the most effort in electrical engineering practices, we strongly recommend DBEM for industrial applications.
|Appears in Collections:||河海工程學系|
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