Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • Home
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
  • Explore by
    • Research Outputs
    • Researchers
    • Organizations
    • Projects
  • Communities & Collections
  • SDGs
  • Sign in
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 電機工程學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/25299
DC FieldValueLanguage
dc.contributor.authorLi, Tzu-Chienen_US
dc.contributor.authorLi, Dong-Linen_US
dc.contributor.authorHo, Jiashowen_US
dc.contributor.authorYu, Chih-Chiangen_US
dc.contributor.authorWang, Sheng-Shihen_US
dc.contributor.authorHo, Jyh-Jieren_US
dc.date.accessioned2024-11-01T06:27:41Z-
dc.date.available2024-11-01T06:27:41Z-
dc.date.issued2024/4/1-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/25299-
dc.description.abstractUsing a stainless shadow mask combined with a magnetron-ion-assisted deposition (IAD) sputtering system, we investigate the surface morphologies and optical properties of microfilms. Optimal color-filter (CF) coating microfilms with niobium pent-oxide (Nb2O5)/silicon dioxide (SiO2) multilayers on a hard polycarbonate (HPC) substrate, grown at 85 degrees C and 50 SCCM oxygen flow, can obtain a fairly uniform thickness (with an average roughness of 0.083 and 0.106 nm respectively for Nb2O5 and SiO2 films) through all positions. On a flexible HPC substrate with the Nb2O5/SiO2 microfilms, meanwhile, the peak transmittances measured in the visible range are 95.70% and 91.47%, respectively, for coatings with and without a shadow mask for this new-tech system. For the optimal CF application with a shadow mask, transmittance on each 100 nm band-pass wavelength is enhanced by 4.04% absolute (blue), 2.96% absolute (green), and 2.12% absolute (red). Moreover, the developed new-tech system not only enhances the quality of the films by achieving smoother and uniform surfaces but also reduces deposition time, thereby improving overall process efficiency. For the with-shadow-mask condition, there is little shift at 50% transmittance (T50%), and high transmittance (similar to 97%) is maintained after high-temperature (200 degrees C) baking for 12 h. These results are well above the commercial CF standard (larger than 90%) and demonstrate reliability and good durability for flexible optical applications.en_US
dc.language.isoEnglishen_US
dc.publisherMDPIen_US
dc.relation.ispartofMICROMACHINESen_US
dc.subjectshadow masken_US
dc.subjection-assisted deposition (IAD)en_US
dc.subjectcolor filter (CF)en_US
dc.subjectuniform thicknessen_US
dc.subjectflexible substrateen_US
dc.subject50% transmittance (T50%)en_US
dc.titleEnhancing Thickness Uniformity of Nb<sub>2</sub>O<sub>5</sub>/SiO<sub>2</sub> Multilayers Using Shadow Masks for Flexible Color-Filtering Applicationsen_US
dc.typejournal articleen_US
dc.identifier.doi10.3390/mi15040551-
dc.identifier.isiWOS:001211342200001-
dc.relation.journalvolume15en_US
dc.relation.journalissue4en_US
dc.identifier.eissn2072-666X-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
item.languageiso639-1English-
item.cerifentitytypePublications-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.orcid0000-0003-2618-7718-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:電機工程學系
Show simple item record

Page view(s)

83
checked on Jun 30, 2025

Google ScholarTM

Check

Altmetric

Altmetric

Related Items in TAIR


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Explore by
  • Communities & Collections
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
Build with DSpace-CRIS - Extension maintained and optimized by Logo 4SCIENCE Feedback