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請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/25678
標題: Leakage-Resilient Public Key Encryption with Equality Test Resistant to Side-channel Attacks
作者: Tsai, Tung-tso 
Lin, Han-yu 
Chen, Yu-chi
Chen, Yuan-chin
關鍵字: side-channel attacks;leakage-resilient;encryption;equality test;public key system
公開日期: 2025
出版社: INST INFORMATION SCIENCE
卷: 41
期: 1
起(迄)頁: 155-176
來源出版物: JOURNAL OF INFORMATION SCIENCE AND ENGINEERING
摘要: 
Public key encryption (PKE) plays a crucial role in protecting sensitive information. It allows the use of a pair of keys - a public key and a secret key. The public key can be shared with anyone for encrypting messages, but only the secret key can decrypt these messages. However, traditional PKE schemes only support basic cryptographic operations such as encryption and decryption, and do not provide additional functionality such as equality test. Public key encryption with equality test (PKEET) is an extension of PKE that allows a third party to verify if two ciphertexts, encrypted using distinct public keys, originate from the same plaintext. Notably, this verification is performed while ensuring that the third party remains oblivious to the actual plaintext. In computer security, side-channel attacks are a common type of attacks that typically involves attacking the physical implementation of cryptographic algorithms, such as measuring the power consumption of a computer chip, electromagnetic radiation, clock skew, etc., to extract cryptographic keys or sensitive information. The severity of side-channel attacks lies in the fact that attackers do not need to break the cryptographic algorithm to obtain sensitive information but instead exploit the physical implementation of the algorithm. To the best of our knowledge, there is currently no existing PKEET that is capable of resisting side-channel attacks. Therefore, the objective of this paper is to propose the first leakage-resilient public key encryption with equality test (LR-PKEET) that can resist side-channel attacks.
URI: http://scholars.ntou.edu.tw/handle/123456789/25678
ISSN: 1016-2364
DOI: 10.6688/JISE.20250141(1).0009
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