Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • Home
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
  • Explore by
    • Research Outputs
    • Researchers
    • Organizations
    • Projects
  • Communities & Collections
  • SDGs
  • Sign in
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 通訊與導航工程學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/26426
Title: Debris Pattern Recognition Based on Visual Sensor and Image Stitching Technology
Authors: Zheng, Wei-Yuan
Juang, Jih-Gau 
Keywords: image stitching;object detection;deep learning
Issue Date: 2025
Publisher: MYU, SCIENTIFIC PUBLISHING DIVISION
Journal Volume: 37
Journal Issue: 6
Start page/Pages: 2463-2487
Source: SENSORS AND MATERIALS
Abstract: 
In this study, we applied multiple unmanned aerial vehicles (UAVs) and visual sensors with deep learning neural networks, You Only Look Once (YOLO), to quickly and effectively recognize significant areas of debris. Information on debris locations, area sizes, and images is sent to the monitoring system. Then, the debris distribution is analyzed, and the source of the debris can be found. The pattern recognition process uses a variety of feature detection methods, description, and point matching for real-time image stitching of the scene. The UAVs can obtain large-area scene images and check whether undetected debris exists. A comparison with different YOLO models is given. The effects of debris recognition and the consequences of various types of data and image stitching during the image stitching process are applied to analyze the real-time image stitching effects by different methods.
URI: http://scholars.ntou.edu.tw/handle/123456789/26426
ISSN: 0914-4935
DOI: 10.18494/SAM5557
Appears in Collections:通訊與導航工程學系

Show full item record

Google ScholarTM

Check

Altmetric

Altmetric

Related Items in TAIR


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Explore by
  • Communities & Collections
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
Build with DSpace-CRIS - Extension maintained and optimized by Logo 4SCIENCE Feedback