http://scholars.ntou.edu.tw/handle/123456789/26426| 標題: | Debris Pattern Recognition Based on Visual Sensor and Image Stitching Technology | 作者: | Zheng, Wei-Yuan Juang, Jih-Gau |
關鍵字: | image stitching;object detection;deep learning | 公開日期: | 2025 | 出版社: | MYU, SCIENTIFIC PUBLISHING DIVISION | 卷: | 37 | 期: | 6 | 起(迄)頁: | 2463-2487 | 來源出版物: | SENSORS AND MATERIALS | 摘要: | In this study, we applied multiple unmanned aerial vehicles (UAVs) and visual sensors with deep learning neural networks, You Only Look Once (YOLO), to quickly and effectively recognize significant areas of debris. Information on debris locations, area sizes, and images is sent to the monitoring system. Then, the debris distribution is analyzed, and the source of the debris can be found. The pattern recognition process uses a variety of feature detection methods, description, and point matching for real-time image stitching of the scene. The UAVs can obtain large-area scene images and check whether undetected debris exists. A comparison with different YOLO models is given. The effects of debris recognition and the consequences of various types of data and image stitching during the image stitching process are applied to analyze the real-time image stitching effects by different methods. |
URI: | http://scholars.ntou.edu.tw/handle/123456789/26426 | ISSN: | 0914-4935 | DOI: | 10.18494/SAM5557 |
| 顯示於: | 通訊與導航工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。