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請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/26426
標題: Debris Pattern Recognition Based on Visual Sensor and Image Stitching Technology
作者: Zheng, Wei-Yuan
Juang, Jih-Gau 
關鍵字: image stitching;object detection;deep learning
公開日期: 2025
出版社: MYU, SCIENTIFIC PUBLISHING DIVISION
卷: 37
期: 6
起(迄)頁: 2463-2487
來源出版物: SENSORS AND MATERIALS
摘要: 
In this study, we applied multiple unmanned aerial vehicles (UAVs) and visual sensors with deep learning neural networks, You Only Look Once (YOLO), to quickly and effectively recognize significant areas of debris. Information on debris locations, area sizes, and images is sent to the monitoring system. Then, the debris distribution is analyzed, and the source of the debris can be found. The pattern recognition process uses a variety of feature detection methods, description, and point matching for real-time image stitching of the scene. The UAVs can obtain large-area scene images and check whether undetected debris exists. A comparison with different YOLO models is given. The effects of debris recognition and the consequences of various types of data and image stitching during the image stitching process are applied to analyze the real-time image stitching effects by different methods.
URI: http://scholars.ntou.edu.tw/handle/123456789/26426
ISSN: 0914-4935
DOI: 10.18494/SAM5557
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