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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/26683
DC FieldValueLanguage
dc.contributor.authorWu, Chia-Chunen_US
dc.contributor.authorChen, Cheng-Yingen_US
dc.contributor.authorChiu, Sheng-Kueien_US
dc.contributor.authorTang, Chien-Jenen_US
dc.date.accessioned2026-08-10T03:11:47Z-
dc.date.available2026-08-10T03:11:47Z-
dc.date.issued2026/5/9-
dc.identifier.issn0957-4522-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/26683-
dc.description.abstractCopper indium gallium selenide (CIGS) thin-film solar cells are a leading technology for next-generation photovoltaics due to their high absorption coefficients and tunable electronic properties. However, achieving optimal device performance via scalable methods like magnetron sputtering is critically dependent on precise stoichiometric control of the quaternary absorber layer, which remains a significant challenge. We fabricated CIGS thin films by sputtering from two distinct targets, one slightly Cu-poor and one Cu-rich, followed by a rapid thermal selenization process. We found that annealing at 500 degrees C for 30 minutes is optimal for producing highly crystalline films with minimal secondary phases. Devices fabricated using the Cu-poor target achieved a power conversion efficiency of 4.6%, with an open-circuit voltage (V-oc) of 412.5 mV and a short-circuit current density (J(sc)) of 19.14 mA/cm(2). Engineering the target stoichiometry is a crucial and direct strategy for simplifying the fabrication and enhancing the performance of sputtered CIGS photovoltaics.en_US
dc.language.isoEnglishen_US
dc.publisherSPRINGERen_US
dc.relation.ispartofJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICSen_US
dc.titleStructural and photovoltaic properties of sputtered CIGS thin films: the effect of quaternary target stoichiometryen_US
dc.typejournal articleen_US
dc.identifier.doi10.1007/s10854-026-17363-0-
dc.identifier.isiWOS:001761417600004-
dc.relation.journalvolume37en_US
dc.relation.journalissue13en_US
dc.identifier.eissn1573-482X-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1English-
item.fulltextno fulltext-
item.openairetypejournal article-
item.grantfulltextnone-
item.cerifentitytypePublications-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Engineering-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:光電與材料科技學系
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