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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/26714
DC FieldValueLanguage
dc.contributor.authorChen, Zheng-Zheen_US
dc.contributor.authorPeng, Tzu-Yuen_US
dc.contributor.authorChang, Chiao-Yunen_US
dc.contributor.authorTsai, Po-Chengen_US
dc.contributor.authorWang, Yen-Yuen_US
dc.contributor.authorTsai, Ya-Tingen_US
dc.contributor.authorShiu, Hung Weien_US
dc.contributor.authorLin, Shih-Yenen_US
dc.contributor.authorLu, Yu-Jungen_US
dc.contributor.authorShih, Min-Hsiungen_US
dc.date.accessioned2026-08-10T03:11:55Z-
dc.date.available2026-08-10T03:11:55Z-
dc.date.issued2026/4/16-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/26714-
dc.description.abstractTwo-dimensional (2D) monolayered (ML) transition-metal dichalcogenides (TMDCs) show strong potential for compact optoelectronic devices, such as light-emitting devices (LEDs). Among all, ML WSe2 can potentially offer the highest external quantum efficiency (EQE) under ambient conditions. However, ML TMDC LEDs with conventional noble metal electrodes face challenges like heat accumulation and intensity quenching. We addressed these limitations by incorporating semi-metal HfN electrodes into AC-driven ML WSe2 LEDs. Replacing standard silver electrodes with HfN nearly doubled the EL intensity and reduced the quenching rate by 83%. After 2 & times;109 times of AC pulses injected, HfN could still help maintain over 80% of intensity magnitude, while Ag-electrode LEDs were almost burned out. Furthermore, HfN-electrode LEDs demonstrated superior excitonic EL stability and distinct defect-state recombination suppression after high-temperature treatment. These results highlight HfN electrodes' potential for durable TMDC LEDs and broader applications in 2D photodetectors, modulators, and integrated optoelectronic systems in the future.en_US
dc.language.isoEnglishen_US
dc.publisherNATURE PORTFOLIOen_US
dc.relation.ispartofNPJ 2D MATERIALS AND APPLICATIONSen_US
dc.titleEnhancing electrically driven excitonic emission stability in WSe<sub>2</sub> monolayer through contact engineering with HfN electrodeen_US
dc.typejournal articleen_US
dc.identifier.doi10.1038/s41699-026-00697-y-
dc.identifier.isiWOS:001792103700001-
dc.relation.journalvolume10en_US
dc.relation.journalissue1en_US
dc.relation.pages9en_US
dc.identifier.eissn2397-7132-
item.openairetypejournal article-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1English-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextno fulltext-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:電機工程學系
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