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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/4429
DC 欄位值語言
dc.contributor.authorZhi-Ting Zhengen_US
dc.contributor.authorWu Kaien_US
dc.contributor.authorYu-Ren Huangen_US
dc.contributor.authorYung-I Chenen_US
dc.date.accessioned2020-11-19T00:37:43Z-
dc.date.available2020-11-19T00:37:43Z-
dc.date.issued2017-06-
dc.identifier.issn0169-4332-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/4429-
dc.description.abstractRu0.63Al0.37 coatings were deposited through a cyclical gradient concentration deposition at 400 °C with a substrate-holder rotation speed of 1 rpm by direct current magnetron cosputtering. Scanning electron microscopy revealed that the as-deposited coatings exhibited a multilayer structure along with the columnar structure. The oxidation behavior of the Ru0.63Al0.37 coatings was examined through X-ray diffraction, Auger electron spectroscopy, transmission electron microscopy, and X-ray photoelectron spectroscopy. Oxidation kinetics was measured using a thermogravimetric analyzer. Internal oxidation was observed for Ru0.63Al0.37 coatings annealed in a 1% O2–99% Ar atmosphere at 400–600 °C accompanied with activation energies of 72–84 kJ/mol. By contrast, external oxidation was observed after annealing at 700–800 °C, resulting in the formation of a continuous alumina scale consisting of crystalline δ-Al2O3 domains, which can be attributable to the outward diffusion of Al.en_US
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.ispartofApplied Surface Scienceen_US
dc.subjectAuger electron spectroscopyen_US
dc.subjectKineticsen_US
dc.subjectMultilayer coatingsen_US
dc.subjectNanostructureen_US
dc.subjectOxidationen_US
dc.subjectX-ray photoelectron spectroscopyen_US
dc.titleOxidation behavior of Ru–Al multilayer coatingsen_US
dc.typejournal articleen_US
dc.identifier.doi<Go to ISI>://WOS:000398011600001-
dc.identifier.doi<Go to ISI>://WOS:000398011600001-
dc.identifier.doi<Go to ISI>://WOS:000398011600001-
dc.identifier.doi10.1016/j.apsusc.2017.02.096-
dc.identifier.doi<Go to ISI>://WOS:000398011600001-
dc.identifier.doi<Go to ISI>://WOS:000398011600001-
dc.identifier.url<Go to ISI>://WOS:000398011600001-
dc.relation.journalvolume406en_US
dc.relation.pages1-7en_US
item.openairetypejournal article-
item.fulltextno fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.orcidhttps://orcid.org/0000-0001-8791-7775-
crisitem.author.orcid0000-0003-0689-5709-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
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