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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/4433
DC 欄位值語言
dc.contributor.authorHsieh, H. H.en_US
dc.contributor.authorWu Kaien_US
dc.contributor.authorPan, M. X.en_US
dc.contributor.authorNieh, T. G.en_US
dc.contributor.authorRong-Tan Huangen_US
dc.date.accessioned2020-11-19T00:37:44Z-
dc.date.available2020-11-19T00:37:44Z-
dc.date.issued2004-10-
dc.identifier.issn0966-9795-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/4433-
dc.description.abstractThe oxidation and phase transformation of three Zr-base amorphous alloys, Zr–20Cu–12Ni–10Al–5Ti (Zr53), Zr–30Cu–10Al–5Ni (Zr55), and Zr–15Cu–10Al–10Ni (Zr65), were studied over the temperature range of 300–500 °C in dry air. Oxidation kinetics of these alloys generally followed a parabolic rate law at T>350 °C, but linear kinetics was obeyed at 300–350 °C. It was found that Zr65 was the most oxidation-resistant alloy among the three alloys studied. Scales formed on the alloys during oxidation consisted of mainly tetragonal- and monoclinic-ZrO2 (t- and m-ZrO2), and minor CuO and NiO (only detected in Zr53). The amount of m-ZrO2 formed strongly depends upon the alloy composition, exposure time, and temperature. TEM results showed that a significant amount of nano-grained Zr2Cu polycrystals formed beneath the amorphous oxide-scale in Zr53, indicating phase transformation has taken place. By contrast, Zr55 and Zr65 amorphous substrates transformed into Zr2Cu and ZrAl after oxidation.en_US
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.ispartofIntermetallicsen_US
dc.subjectB. Oxidationen_US
dc.subjectB. Phase transformationen_US
dc.subjectB. Glasses, metallicen_US
dc.titleEffect of Zr-content on the oxidation and phase transformation of Zr-base amorphous alloys in airen_US
dc.typejournal articleen_US
dc.identifier.doi<Go to ISI>://WOS:000224566700010-
dc.identifier.doi10.1016/j.intermet.2004.04.024-
dc.identifier.doi<Go to ISI>://WOS:000224566700010-
dc.identifier.doi<Go to ISI>://WOS:000224566700010-
dc.identifier.url<Go to ISI>://WOS:000224566700010-
dc.relation.journalvolume12en_US
dc.relation.journalissue10-11en_US
dc.relation.pages1089-1096en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.orcidhttps://orcid.org/0000-0001-8791-7775-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
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