http://scholars.ntou.edu.tw/handle/123456789/4548| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Liu, Y. H. | en_US |
| dc.contributor.author | Wang, C. K. | en_US |
| dc.contributor.author | Ting, Y. | en_US |
| dc.contributor.author | Lin, W. Z. | en_US |
| dc.contributor.author | Kang, Z. H. | en_US |
| dc.contributor.author | Chen, C. S. | en_US |
| dc.contributor.author | Jih-Shang Hwang | en_US |
| dc.date.accessioned | 2020-11-19T01:22:10Z | - |
| dc.date.available | 2020-11-19T01:22:10Z | - |
| dc.date.issued | 2009-10 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/4548 | - |
| dc.relation.ispartof | International Journal of Molecular Sciences | en_US |
| dc.title | In-TFT-Array-Process Micro Defect Inspection Using Nonlinear Principal Component Analysis | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.3390/ijms10104498 | - |
| dc.identifier.doi | <Go to ISI>://WOS:000271276000017 | - |
| dc.identifier.url | <Go to ISI>://WOS:000271276000017 | |
| dc.relation.journalvolume | 10 | en_US |
| dc.relation.journalissue | 10 | en_US |
| item.grantfulltext | none | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.cerifentitytype | Publications | - |
| crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
| crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.orcid | 0000-0003-3919-4917 | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 光電與材料科技學系 | |
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