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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/4681
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dc.contributor.authorRen-Kae Shiueen_US
dc.contributor.authorLeu-Wen Tsayen_US
dc.contributor.authorChun-Lun Linen_US
dc.contributor.authorJia-Lin Ouen_US
dc.date.accessioned2020-11-19T02:23:42Z-
dc.date.available2020-11-19T02:23:42Z-
dc.date.issued2003-03-
dc.identifier.issn0022-2461-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/4681-
dc.description.abstractSn-Bi-Ag-(In) solder alloys have been extensively studied in the study. The experimental results reveals that the liquidus temperatures of Sn-(1–5) Bi-(2–3.5)Ag-(0–10)In solders are between 201.7 and 225.3°C, which were higher than that of the most popular eutectic Pb-Sn solder (183°C). Additions of (5–10) wt% In into Sn-Bi-Ag solders can effectively decrease the melting point of the solder alloy. However, the gap between T s and T L temperatures increases with the additions of Bi and In into Sn-Bi-Ag-(In) solders. Although there is no flux applied during soldering, most Sn-Bi-Ag-(In) solder alloys can well bond the Au/Ni metallized copper substrate. 94Sn-3Bi-3Ag solder demonstrates the lowest wetting angle of 45° among all test samples. Thermal expansion coefficients of both 94Sn-3Bi-3Ag and 90Sn-2Bi-3Ag-5In solders are slightly less than that of 63Sn-37Pb. Both 90Sn-2Bi-3Ag-5In/substrate and 94Sn-3Bi-3Ag/substrate interfaces demonstrate similar reaction kinetics in the experiment. The stability of the interface is greatly impaired during 90°C aging. Some locations of the electroless Ni layer break down, and new phases are formed nearby the interface during aging treatment. Initially, the growth of Ni-rich (Ni,Cu)3Sn4 phase dominates the interfacial reaction. However, the growth of Cu-rich (Cu,Ni)6Sn5 phase will dominate the reaction layer for specimens aged at 90°C for long time periods.en_US
dc.language.isoenen_US
dc.relation.ispartofJournal of Materials Scienceen_US
dc.subjectThermal Expansionen_US
dc.subjectExpansion Coefficienten_US
dc.subjectThermal Expansion Coefficienten_US
dc.subjectLiquidus Temperatureen_US
dc.subjectInterfacial Reactionen_US
dc.titleA study of Sn-Bi-Ag-(In) lead-free soldersen_US
dc.typejournal articleen_US
dc.identifier.doi10.1023/a:1022822127193-
dc.identifier.isiWOS:000181626100021-
dc.relation.journalvolume38en_US
dc.relation.journalissue6en_US
dc.relation.pages1269–1279en_US
item.openairetypejournal article-
item.fulltextno fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.languageiso639-1en-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCenter of Excellence for Ocean Engineering-
crisitem.author.orcid0000-0003-1644-9745-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
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