A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8027

Title:	A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy
Authors:	Chen, R. S. Chen, C. C. Huang, Y. S. Chia, C. T. Chen, H. P. Tsai, D. S. Kwong-Kau Tiong
Issue Date:	Aug-2004
Journal Volume:	131
Journal Issue:	6
Source:	Solid State Communications
URI:	http://scholars.ntou.edu.tw/handle/123456789/8027
ISSN:	0038-1098
DOI:	10.1016/j.ssc.2004.06.002 ://WOS:000223011700001
Appears in Collections:	電機工程學系

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