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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8027
Title: A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy
Authors: Chen, R. S.
Chen, C. C.
Huang, Y. S.
Chia, C. T.
Chen, H. P.
Tsai, D. S.
Kwong-Kau Tiong 
Issue Date: Aug-2004
Journal Volume: 131
Journal Issue: 6
Source: Solid State Communications
URI: http://scholars.ntou.edu.tw/handle/123456789/8027
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2004.06.002
://WOS:000223011700001
Appears in Collections:電機工程學系

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