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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8039
Title: Deposition and structural characterization of nanostructured RuO2 on rutile-TiO2/sapphire(100) templates by reactive radio frequency magnetron sputtering
Authors: Chen, Y. M.
Yeh, C. N.
Chen, C. A.
Huang, Y. S.
Hsu, H. P.
Tsai, D. S.
Kwong-Kau Tiong 
Issue Date: Jan-2012
Journal Volume: 520
Journal Issue: 7
Source: Thin Solid Films
URI: http://scholars.ntou.edu.tw/handle/123456789/8039
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2011.12.045
://WOS:000301085100074
Appears in Collections:電機工程學系

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