Surface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8041

Title:	Surface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure
Authors:	Cheng, Y. T. Huang, Y. S. Lin, D. Y. Kwong-Kau Tiong Pollak, F. H. Evans, K. R.
Issue Date:	Aug-2001
Journal Volume:	79
Journal Issue:	7
Source:	Applied Physics Letters
URI:	http://scholars.ntou.edu.tw/handle/123456789/8041
ISSN:	0003-6951
DOI:	10.1063/1.1392974 ://WOS:000170277500019
Appears in Collections:	電機工程學系

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