Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8135

Title:	Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures
Authors:	Liang, J. S. Wang, S. D. Huang, Y. S. Tien, C. W. Chang, Y. M. Chen, C. W. Li, N. Y. Kwong-Kau Tiong Pollak, F. H.
Issue Date:	Jan-2003
Journal Volume:	15
Journal Issue:	2
Source:	Journal of Physics-Condensed Matter
URI:	http://scholars.ntou.edu.tw/handle/123456789/8135
ISSN:	0953-8984
DOI:	10.1088/0953-8984/15/2/306 ://WOS:000180989100020 ://WOS:000180989100020
Appears in Collections:	電機工程學系

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