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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8183
Title: Growth and characterization of well-aligned densely-packed rutile TiO2 nanocrystals on sapphire (100) and (012) substrates by reactive magnetron sputtering
Authors: Yeh, C. N.
Chen, Y. M.
Chen, C. A.
Huang, Y. S.
Tsai, D. S.
Kwong-Kau Tiong 
Issue Date: May-2010
Journal Volume: 518
Journal Issue: 15
Source: Thin Solid Films
URI: http://scholars.ntou.edu.tw/handle/123456789/8183
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2009.11.014
://WOS:000278242000011
Appears in Collections:電機工程學系

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