| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
|---|---|---|---|---|---|---|
| 2005 | Bias-temperature instability on fully silicided-germanided gates/high-k Al2O3CMOSFETs | Liao, C. C.; Yu, D. S.; Cheng-Fa Cheng ; Chin, A. | Journal of the Electrochemical Society | |||
| 2004 | The copper contamination effect of Al2O3 gate dielectric on Si | Liao, C. C.; Cheng-Fa Cheng ; Yu, D. S.; Chin, A. | Journal of the Electrochemical Society |
