Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link |
---|---|---|---|---|---|
2008 | Improvement on Reliability Properties of Metal-Ferroelectric (BiFeO3)-Insulator (HfO2)-Semiconductor Structures Fabricated by Oxygen-Incorporated Magnetron Sputtering | Juan, T. P. C.; Lu, J. H.; Ming-Wei Lu | Journal of the Electrochemical Society | ||
2009 | Influence of Ar/O-2 ratio on the electrical properties of metal-ferroelectric (BiFeO3)-insulator (HfO2)-semiconductor capacitors fabricated by rf magnetron sputtering | Juan, T. P. C.; Lu, J. H.; Ming-Wei Lu | Journal of Vacuum Science & Technology B |