公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 |
---|---|---|---|---|---|
2009 | In-TFT-Array-Process Micro Defect Inspection Using Nonlinear Principal Component Analysis | Liu, Y. H.; Wang, C. K.; Ting, Y.; Lin, W. Z.; Kang, Z. H.; Chen, C. S.; Jih-Shang Hwang | International Journal of Molecular Sciences | ||
2014 | A Support Vector Data Description Committee for Face Detection | Liu, Y. H.; Ting, Y.; Shyu, S. S.; Chen, C. K.; Lee, C. L.; Mu-Der Jeng | Mathematical Problems in Engineering |