Results 1-3 of 3 (Search time: 0.018 seconds).
Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 1998 | Characterization of sputtered iridium dioxide thin films | Liao, P. C.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Journal of Materials Research | ||
2 | 1997 | Characterization of IrO2 thin films by Raman spectroscopy | Liao, P. C.; Chen, C. S.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Thin Solid Films | ||
3 | 1996 | Characterization of RuO2 thin films deposited on Si by metal-organic chemical vapor deposition | Liao, P. C.; Mar, S. Y.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Thin Solid Films |