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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8139
Title: Characterization of sputtered iridium dioxide thin films
Authors: Liao, P. C.
Ho, W. S.
Huang, Y. S.
Kwong-Kau Tiong 
Issue Date: May-1998
Journal Volume: 13
Journal Issue: 5
Source: Journal of Materials Research
URI: http://scholars.ntou.edu.tw/handle/123456789/8139
ISSN: 0884-2914
DOI: 10.1557/jmr.1998.0187
://WOS:000073272500038
Appears in Collections:電機工程學系

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