Results 1-5 of 5 (Search time: 0.008 seconds).
Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2011 | Wafer defect inspection by neural analysis of region features | Chang, C. Y.; Li, C. H.; Chang, Y. C.; Mu-Der Jeng | Journal of Intelligent Manufacturing | ||
2 | 2011 | Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection | Li, C. H.; Chang, C. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
3 | 2009 | Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection | Chang, C. Y.; Li, C. H.; Lin, S. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
4 | 2009 | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Chang, C. Y.; Li, C. H.; Chang, J. W.; Mu-Der Jeng | Expert Systems with Applications | ||
5 | 2008 | LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION | Chang, C. Y.; Li, C. H.; Chang, C. H.; Mu-Der Jeng | International Journal of Innovative Computing Information and Control |