第 1 到 8 筆結果,共 8 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2020 | The Optical and Microstructural Characterization of the Polymeric Thin Films with Self-Assembly Nanoparticles Prepared by Spin-Coating Techniques | Lee, K. M.; Huang, C. H.; Chang, C. Y.; Chung-Cheng Chang | Crystals | ||
2 | 2011 | Wafer defect inspection by neural analysis of region features | Chang, C. Y.; Li, C. H.; Chang, Y. C.; Mu-Der Jeng | Journal of Intelligent Manufacturing | ||
3 | 2011 | Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection | Li, C. H.; Chang, C. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
4 | 2009 | Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection | Chang, C. Y.; Li, C. H.; Lin, S. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
5 | 2009 | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Chang, C. Y.; Li, C. H.; Chang, J. W.; Mu-Der Jeng | Expert Systems with Applications | ||
6 | 2009 | A Six-Week Acupoint Stimulation Intervention for Quitting Smoking | Mei-Ling Yeh ; Chang, C. Y.; Chu, N. F.; Chen, H. H. | American Journal of Chinese Medicine | ||
7 | 2008 | LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION | Chang, C. Y.; Li, C. H.; Chang, C. H.; Mu-Der Jeng | International Journal of Innovative Computing Information and Control | ||
8 | 2008 | Integrated two Hopfield neural networks for automatic LED defect inspection | Chang, C. Y.; Chang, C. W.; Lin, S. Y.; Mu-Der Jeng | Journal of the Chinese Society of Mechanical Engineers |