第 1 到 2 筆結果,共 2 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2008 | LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION | Chang, C. Y.; Li, C. H.; Chang, C. H.; Mu-Der Jeng | International Journal of Innovative Computing Information and Control | ||
2 | 2008 | Integrated two Hopfield neural networks for automatic LED defect inspection | Chang, C. Y.; Chang, C. W.; Lin, S. Y.; Mu-Der Jeng | Journal of the Chinese Society of Mechanical Engineers |