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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2008 | LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION | Chang, C. Y.; Li, C. H.; Chang, C. H.; Mu-Der Jeng | International Journal of Innovative Computing Information and Control | ||
2 | 2008 | Integrated two Hopfield neural networks for automatic LED defect inspection | Chang, C. Y.; Chang, C. W.; Lin, S. Y.; Mu-Der Jeng | Journal of the Chinese Society of Mechanical Engineers | ||
3 | 2008 | A maximally permissive deadlock prevention policy for FMS based on Petri net siphon control and the theory of regions | Li, Z. W.; Zhou, M. C.; Mu-Der Jeng | Ieee Transactions on Automation Science and Engineering |