第 1 到 3 筆結果,共 3 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2008 | LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION | Chang, C. Y.; Li, C. H.; Chang, C. H.; Mu-Der Jeng | International Journal of Innovative Computing Information and Control | ||
2 | 2008 | Integrated two Hopfield neural networks for automatic LED defect inspection | Chang, C. Y.; Chang, C. W.; Lin, S. Y.; Mu-Der Jeng | Journal of the Chinese Society of Mechanical Engineers | ||
3 | 2008 | A maximally permissive deadlock prevention policy for FMS based on Petri net siphon control and the theory of regions | Li, Z. W.; Zhou, M. C.; Mu-Der Jeng | Ieee Transactions on Automation Science and Engineering |