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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2011 | Deep and Alignment Free Patterned Etching of GaN Surface Using an Atomic Force Microscope | Chen, D. C.; Chen, L. W.; Hu, Z. S.; You, Z. Y.; Wu, C. C.; Tai-Yuan Lin ; Chattopadhyay, S.; Jih-Shang Hwang ; Tsong-Ru Tsai | Journal of Nanoscience and Nanotechnology |