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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2011 | Deep and Alignment Free Patterned Etching of GaN Surface Using an Atomic Force Microscope | Chen, D. C.; Chen, L. W.; Hu, Z. S.; You, Z. Y.; Wu, C. C.; Tai-Yuan Lin ; Chattopadhyay, S.; Jih-Shang Hwang ; Tsong-Ru Tsai | Journal of Nanoscience and Nanotechnology | ||
2 | 2009 | Direct patterning of zinc oxide with control of reflected color through nano-oxidation using an atomic force microscope | Chen, L. W.; Chen, T. C.; Kuo, C. W.; Hu, Z. S.; Wu, Y. J.; Tai-Yuan Lin ; Jhuo, Y. Y.; Lin, C. M.; Liu, Y. H.; Jih-Shang Hwang ; Tsong-Ru Tsai ; Chih-Yung Cheng | Nanotechnology | 5 | |
3 | 2009 | Spectral dependence of time-resolved photoreflectance of InN epitaxial films | Chang, C. Y.; Kuo, C. W.; Tai-Yuan Lin ; Gwo, S.; Jih-Shang Hwang ; Tsong-Ru Tsai | Applied Physics Letters | 3 | |
4 | 2006 | Terahertz response of GaN thin films | Chen, S. J.; Chang, C. F.; Hsu, S. H.; Tai-Yuan Lin ; Chi, C. C.; Tsong-Ru Tsai | Optics Express | 33 |