第 1 到 5 筆結果,共 5 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2013 | Imaging layer number and stacking order through formulating Raman fingerprints obtained from hexagonal single crystals of few layer graphene | Jih-Shang Hwang ; Yu-Hsiang Lin; Jeong-Yuan Hwang; Railing Chang ; Surojit Chattopadhyay; Chang-Jiang Chen; Peilin Chen; Hai-Pang Chiang ; Tsong-Ru Tsai ; Li-Chyong Chen; Kuei-Hsien Chen | Nanotechnology | 41 | |
2 | 2011 | Deep and Alignment Free Patterned Etching of GaN Surface Using an Atomic Force Microscope | Chen, D. C.; Chen, L. W.; Hu, Z. S.; You, Z. Y.; Wu, C. C.; Tai-Yuan Lin ; Chattopadhyay, S.; Jih-Shang Hwang ; Tsong-Ru Tsai | Journal of Nanoscience and Nanotechnology | ||
3 | 2009 | Spectral dependence of time-resolved photoreflectance of InN epitaxial films | Chang, C. Y.; Kuo, C. W.; Tai-Yuan Lin ; Gwo, S.; Jih-Shang Hwang ; Tsong-Ru Tsai | Applied Physics Letters | 3 | |
4 | 2009 | Characterization of nonlinear absorption of InN epitaxial films with femtosecond pulsed transmission Z-scan measurements | Tsong-Ru Tsai ; Tsung-Han Wu; Jung-Cheng Liao; Tai-Huei Wei ; Hai-Pang Chiang ; Jih-Shang Hwang ; Din-Ping Tsai ; Yang-Fang Chen | Journal of Applied Physics | 7 | |
5 | 2009 | Direct patterning of zinc oxide with control of reflected color through nano-oxidation using an atomic force microscope | Chen, L. W.; Chen, T. C.; Kuo, C. W.; Hu, Z. S.; Wu, Y. J.; Tai-Yuan Lin ; Jhuo, Y. Y.; Lin, C. M.; Liu, Y. H.; Jih-Shang Hwang ; Tsong-Ru Tsai ; Chih-Yung Cheng | Nanotechnology | 5 |