第 1 到 3 筆結果,共 3 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2010 | A TEM investigation of retained defects in Si wafer by 1 MeV Si ions bombardment | Hsu, J. Y.; Rong-Tan Huang ; Hung, M. J.; Yu, Y. C. | Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms | ||
2 | 2010 | Internal oxidation of Mo-Ru coatings | Yung-I Chen ; Chang, L. C.; Tsai, B. N.; Kuo, Y. C.; Rong-Tan Huang | Thin Solid Films | ||
3 | 2010 | Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation | Shiu, J. Y.; Lu, C. Y.; Su, T. Y.; Rong-Tan Huang ; Zirath, H.; Rorsman, N.; Chang, E. Y. | Japanese Journal of Applied Physics |