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公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
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1 | 2017 | An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm | Chiang, Y. C.; Jinn-Tong Chiu ; Chang, Z. J.; Chang, D. Y. | Proceedings of the Institution of Mechanical Engineers Part C-Journal of Mechanical Engineering Science | 0 |