An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm

請用此 Handle URI 來引用此文件： http://scholars.ntou.edu.tw/handle/123456789/2871

標題:	An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm
作者:	Chiang, Y. C. Jinn-Tong Chiu Chang, Z. J. Chang, D. Y.
公開日期:	九月-2017
卷:	231
期:	18
來源出版物:	Proceedings of the Institution of Mechanical Engineers Part C-Journal of Mechanical Engineering Science
URI:	http://scholars.ntou.edu.tw/handle/123456789/2871
ISSN:	0954-4062
DOI:	10.1177/0954406216645131 ://WOS:000411900900012
顯示於：	系統工程暨造船學系

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