High resolution angular measurement using surface-plasmonresonance via phase interrogation at optimal incident wavelengths

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/16064

Title:	High resolution angular measurement using surface-plasmonresonance via phase interrogation at optimal incident wavelengths
Authors:	Hai-Pang Chiang
Issue Date:	2005
Publisher:	3rd Symposium on Nanophotonics Science and Technology
Conference:	3rd Symposium on Nanophotonics Science and Technology
Description:	舉辦地點: Taroko, Hua-Lien, Taiwan
URI:	http://scholars.ntou.edu.tw/handle/123456789/16064
Appears in Collections:	光電與材料科技學系

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