http://scholars.ntou.edu.tw/handle/123456789/2040| Title: | Investigation of surface properties of Si-doped GaN films by electric force microscopy and photoluminescence | Authors: | Tai-Yuan Lin Su, W. S. Chen, Y. F. |
Issue Date: | 2004 | Journal Volume: | 130 | Journal Issue: | 1-2 | Source: | Solid State Communications | URI: | http://scholars.ntou.edu.tw/handle/123456789/2040 | ISSN: | 0038-1098 | DOI: | 10.1016/j.ssc.2004.01.011 |
| Appears in Collections: | 光電與材料科技學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.