http://scholars.ntou.edu.tw/handle/123456789/22826
標題: | Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells | 作者: | Chiao-Yun Chang Heng Li Yang-Ta Shih Tien-Chang Lu |
關鍵字: | GAN | 公開日期: | 三月-2015 | 出版社: | AIP Publishing | 卷: | 106 | 期: | 9 | 來源出版物: | APPLIED PHYSICS LETTERS | 摘要: | We systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC. |
URI: | http://scholars.ntou.edu.tw/handle/123456789/22826 | ISSN: | 0003-6951 | DOI: | 10.1063/1.4914116 |
顯示於: | 電機工程學系 |
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