http://scholars.ntou.edu.tw/handle/123456789/22843
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Huei-Min Huang | en_US |
dc.contributor.author | Tien-Chang Lu | en_US |
dc.contributor.author | Chiao-Yun Chang | en_US |
dc.contributor.author | Shih-Chun Ling | en_US |
dc.contributor.author | Wei-Wen Chan | en_US |
dc.contributor.author | Hao-Chung Kuo | en_US |
dc.contributor.author | Shing-Chung Wang | en_US |
dc.date.accessioned | 2022-10-31T07:00:13Z | - |
dc.date.available | 2022-10-31T07:00:13Z | - |
dc.date.issued | 2011-08 | - |
dc.identifier.issn | 0733-8724 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/22843 | - |
dc.description.abstract | Non-polar (a-plane) InGaN-GaN multiple quantum wells (MQWs) on the GaN nanorod epitaxially lateral overgrowth templates with different nanorod height have been fabricated. The average in-plane strain in the InGaN MQWs has been determined from 2.73 × 10 -2 to 2.58 × 10 -2 while the nanorod height in templates increases from 0 to 1.7 μm. The polarization ratio of the emission from InGaN MQWs varies from 85 % to 53 % along with the increase of the GaN nanorod height. The reduction of polarization ratio has been attributed to the partial strain relaxation within the epitaxial structures as a result of growth on the GaN nanorod templates and the micro-size air-voids observed in the nanorod templates. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.relation.ispartof | JOURNAL OF LIGHTWAVE TECHNOLOGY | en_US |
dc.subject | LIGHT-EMITTING-DIODES | en_US |
dc.subject | FILMS | en_US |
dc.title | Investigation of Emission Polarization and Strain in InGaN–GaN Multiple Quantum Wells on Nanorod Epitaxially Lateral Overgrowth Templates | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1109/JLT.2011.2164896 | - |
dc.identifier.isi | 000294203100010 | - |
dc.relation.journalvolume | 29 | en_US |
dc.relation.journalissue | 18 | en_US |
dc.relation.pages | 2761-2675 | en_US |
dc.identifier.eissn | 1558-2213 | en_US |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.languageiso639-1 | en_US | - |
item.openairetype | journal article | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | none | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.dept | Department of Electrical Engineering | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
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