http://scholars.ntou.edu.tw/handle/123456789/22974
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jim-Wei Wu | en_US |
dc.contributor.author | Jyun-Jhih Chen | en_US |
dc.contributor.author | Ming-Li Chiang | en_US |
dc.contributor.author | Jen-te Yu | en_US |
dc.contributor.author | Li-Chen Fu | en_US |
dc.date.accessioned | 2022-11-04T01:38:52Z | - |
dc.date.available | 2022-11-04T01:38:52Z | - |
dc.date.issued | 2014-07 | - |
dc.identifier.issn | 1536-125X | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/22974 | - |
dc.description.abstract | Atomic force microscopy (AFM) is capable of producing accurate 3-D images at nanometer resolution. As a result, AFM is widely used in applications related to cell biology, such as the diagnosis and observation of tumor cells. This paper proposes phase-detection mode atomic force microscopy (PM-AFM) for the 3-D reconstruction of cell contours. The proposed three-axis scanning system employs two piezoelectric stages with one and two degrees of freedom, respectively. Accurately rendering the contours of delicate cells required a multi-input multi-output (MIMO) adaptive double integral sliding mode controller (ADISMC) in the xy-plane to overcome uncertainties within the system as well as cross-coupling, hysteresis effect, and external disturbance. An adaptive complementary sliding-mode controller (ACSMC) was installed along the z axis to improve scanning accuracy and overcome the inconvenience of conventional controllers. Phase feedback signals were also used to increase the sensitivity of scanning, while providing faster response times and superior image quality. A comprehensive series of experiments was performed to validate the performance of the proposed system. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.relation.ispartof | IEEE TRANSACTIONS ON NANOTECHNOLOGY | en_US |
dc.subject | ROBUST ADAPTIVE-CONTROL | en_US |
dc.title | Design and Control of Phase-Detection Mode Atomic Force Microscopy for Reconstruction of Cell Contours in Three-Dimensions | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1109/TNANO.2014.2307073 | - |
dc.identifier.isi | 000340104900004 | - |
dc.relation.journalvolume | 13 | en_US |
dc.relation.journalissue | 4 | en_US |
dc.relation.pages | 639-649 | en_US |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.languageiso639-1 | en_US | - |
item.openairetype | journal article | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | none | - |
crisitem.author.dept | Department of Electrical Engineering | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
Appears in Collections: | 電機工程學系 |
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