http://scholars.ntou.edu.tw/handle/123456789/22996
Title: | Single-ZnO-Nanowire Memory | Authors: | Yen-De Chiang Wen-Yuan Chang Ching-Yuan Ho Cheng-Ying Chen Chih-Hsiang Ho Su-Jien Lin Tai-Bor Wu Hau He |
Keywords: | OHMIC CONTACTS;HIGH-SPEED;NONVOLATILE;RESISTANCE | Issue Date: | Jun-2011 | Publisher: | IEEE | Journal Volume: | 58 | Journal Issue: | 6 | Start page/Pages: | 1735-1740 | Source: | Electron Devices, IEEE Transactions on | Abstract: | Single-ZnO-nanowire (NW) memory based on resistive switching is demonstrated for the first time. The NW memory is stable, rewritable, and nonvolatile with on/off ratio up to 7.7 × 10 5 . The O vacancies at the surfaces of ZnO NWs and around the interface of Ti/ZnO NWs observed using X-ray phototelectron spectroscopy, transmission electron microscopy (TEM), selected-area electron diffraction, and high-resolution TEM might play a role in the resistive switching behavior. The endurance of resistive switching can be enhanced by further increasing the sweeping voltage. This paper brings an exciting possibility of building next-generation memory devices based on NWs. |
URI: | http://scholars.ntou.edu.tw/handle/123456789/22996 | ISSN: | 0018-9383 | DOI: | 10.1109/TED.2011.2121914 |
Appears in Collections: | 光電與材料科技學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.