Comparisons of microwave dielectric property measurements by transmission/reflection techniques and resonance techniques

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/3146

Title:	Comparisons of microwave dielectric property measurements by transmission/reflection techniques and resonance techniques
Authors:	Jyh-Jong Sheen
Issue Date:	Apr-2009
Journal Volume:	20
Journal Issue:	4
Source:	Measurement Science and Technology
URI:	http://scholars.ntou.edu.tw/handle/123456789/3146
ISSN:	0957-0233
DOI:	10.1088/0957-0233/20/4/042001 ://WOS:000264386800001
Appears in Collections:	機械與機電工程學系

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