http://scholars.ntou.edu.tw/handle/123456789/3154
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Jyh-Jong Sheen | en_US |
dc.contributor.author | Li, C. Y. | en_US |
dc.contributor.author | Lin, S. W. | en_US |
dc.date.accessioned | 2020-11-18T02:49:58Z | - |
dc.date.available | 2020-11-18T02:49:58Z | - |
dc.date.issued | 2011 | - |
dc.identifier.issn | 0920-5071 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/3154 | - |
dc.relation.ispartof | Journal of Electromagnetic Waves and Applications | en_US |
dc.title | MEASUREMENTS OF MICROWAVE DIELECTRIC PROPERTIES OF (1-X)TIO2-XCATIO(3) AND (1-X)TIO2-XSRTIO3 THIN FILMS BY THE CAVITY PERTURBATION METHOD | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1163/156939311797453962 | - |
dc.identifier.doi | <Go to ISI>://WOS:000295871400012 | - |
dc.identifier.url | <Go to ISI>://WOS:000295871400012 | |
dc.relation.journalvolume | 25 | en_US |
dc.relation.journalissue | 13 | en_US |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
crisitem.author.dept | College of Engineering | - |
crisitem.author.dept | Department of Mechanical and Mechatronic Engineering | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Engineering | - |
顯示於: | 機械與機電工程學系 |
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