MEASUREMENTS OF MICROWAVE DIELECTRIC PROPERTIES OF (1-X)TIO2-XCATIO(3) AND (1-X)TIO2-XSRTIO3 THIN FILMS BY THE CAVITY PERTURBATION METHOD

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/3154

Title:	MEASUREMENTS OF MICROWAVE DIELECTRIC PROPERTIES OF (1-X)TIO2-XCATIO(3) AND (1-X)TIO2-XSRTIO3 THIN FILMS BY THE CAVITY PERTURBATION METHOD
Authors:	Jyh-Jong Sheen Li, C. Y. Lin, S. W.
Issue Date:	2011
Journal Volume:	25
Journal Issue:	13
Source:	Journal of Electromagnetic Waves and Applications
URI:	http://scholars.ntou.edu.tw/handle/123456789/3154
ISSN:	0920-5071
DOI:	10.1163/156939311797453962 ://WOS:000295871400012
Appears in Collections:	機械與機電工程學系

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