http://scholars.ntou.edu.tw/handle/123456789/3517| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.author | Bor-Jiunn Wen | en_US |
| dc.contributor.author | Huang, S. A. | en_US |
| dc.date.accessioned | 2020-11-18T07:31:33Z | - |
| dc.date.available | 2020-11-18T07:31:33Z | - |
| dc.date.issued | 2019-03 | - |
| dc.identifier.issn | 1530-437X | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/3517 | - |
| dc.relation.ispartof | Ieee Sensors Journal | en_US |
| dc.title | Residual Stress Image Inspections Based on Bending Testing for Flexible Transparent Conducting Substrates by Single-Direction Common-Path Image Interferometry | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1109/jsen.2018.2881426 | - |
| dc.identifier.isi | WOS:000458184000011 | - |
| dc.relation.journalvolume | 19 | en_US |
| dc.relation.journalissue | 5 | en_US |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | College of Engineering | - |
| crisitem.author.dept | Department of Mechanical and Mechatronic Engineering | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.orcid | 0000-0003-0163-6070 | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Engineering | - |
| 顯示於： | 機械與機電工程學系 | |
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