Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/4604

Title:	Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
Authors:	Shiu, J. Y. Lu, C. Y. Su, T. Y. Rong-Tan Huang Zirath, H. Rorsman, N. Chang, E. Y.
Issue Date:	2010
Journal Volume:	49
Journal Issue:	2
Source:	Japanese Journal of Applied Physics
URI:	http://scholars.ntou.edu.tw/handle/123456789/4604
ISSN:	0021-4922
DOI:	10.1143/jjap.49.021001 ://WOS:000275665700018
Appears in Collections:	光電與材料科技學系

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