Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation

請用此 Handle URI 來引用此文件： http://scholars.ntou.edu.tw/handle/123456789/4604

標題:	Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
作者:	Shiu, J. Y. Lu, C. Y. Su, T. Y. Rong-Tan Huang Zirath, H. Rorsman, N. Chang, E. Y.
公開日期:	2010
卷:	49
期:	2
來源出版物:	Japanese Journal of Applied Physics
URI:	http://scholars.ntou.edu.tw/handle/123456789/4604
ISSN:	0021-4922
DOI:	10.1143/jjap.49.021001 ://WOS:000275665700018
顯示於：	光電與材料科技學系

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