http://scholars.ntou.edu.tw/handle/123456789/5517
Title: | Optimization of Back Channel Leakage Characteristic in PD SOI p-MOSFET | Authors: | Lo, H. C. Chen, Y. T. Li, C. T. Luo, W. C. Lu, W. Y. Chen, M. C. Cheng-Fa Cheng Chen, T. L. Yang, C. T. Lien, C. H. Fung, S. K. H. Wu, C. C. |
Issue Date: | 2010 | Journal Volume: | 157 | Journal Issue: | 9 | Source: | Journal of the Electrochemical Society | URI: | http://scholars.ntou.edu.tw/handle/123456789/5517 | ISSN: | 0013-4651 | DOI: | 10.1149/1.3459931 |
Appears in Collections: | 通訊與導航工程學系 |
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