http://scholars.ntou.edu.tw/handle/123456789/8739
Title: | Effect of the non-annealed ohmic-recess approach on temperature-dependent properties of a metamorphic high electron mobility transistor | Authors: | Chen, L. Y. Cheng, S. Y. Wen-Shiung Lour Tsai, J. H. Guo, D. F. Tsai, T. H. Chen, T. P. Liu, Y. C. Liu, W. C. |
Issue Date: | Dec-2008 | Journal Volume: | 23 | Journal Issue: | 12 | Source: | Semiconductor Science and Technology | URI: | http://scholars.ntou.edu.tw/handle/123456789/8739 | ISSN: | 0268-1242 | DOI: | 10.1088/0268-1242/23/12/125041 |
Appears in Collections: | 電機工程學系 |
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