Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/15954
標題: Raman Spectrometry of Scattering of Nano-Gold Ceria Films
作者: Idris, Muhammad Nur Syafi'ie Md
Chiang, Hai-Pang 
Muslim, Noormariah
Chau, Yuan-Fong Chou
Mahadi, Abdul Hanif
Voo, Nyuk Yoong
Lim, Chee Ming
關鍵字: Ceria;Electrical Field Enhancement;Finite Element Method;Gold Nano-Particles;Plasmonic
公開日期: 1-十一月-2018
出版社: American Scientific Publishers
卷: 24
期: 11
起(迄)頁: 8940-8943
來源出版物: Advanced Science Letters
摘要: 
Gold nano-particles (NPs) were sputtered onto spin-coated ceria film, and different Au NPs concentration were achieved by varying the deposition time; at 90 s (90Au–CeO2) and 120 s (120Au–CeO2). The nano-gold ceria film was exposed to a low power laser irradiation (10 mW) at 532 nm to produce localized surface plasmons resonance (LSPR). The LSPR from the gold NPs causes the magnification of the F2g Raman mode of ceria through surface-enhanced Raman scattering (SERS), and induced crystals anharmonicity caused by plasmon heating. The Raman intensities of ceria for 90Au–CeO2 and 120Au–CeO2 were almost similar, however, the redshift and full-width at half maximum (FWHM) of the ceria F2g Raman mode were greater for 90Au–CeO2 This was due to the gaps present between the gold NPs, which contribute to the enhancement of electrical field intensity distribution. In the case of 120Au–CeO2, the electrical field enhancement was reduced because of the inter-NP gaps were reduced with the increase in concentration of the gold NPs. The finite element method (FEM) was used to demonstrate the effect of the inter-NP gaps on the electrical field intensity distribution.
URI: http://scholars.ntou.edu.tw/handle/123456789/15954
ISSN: 1936-6612
DOI: 10.1166/asl.2018.12380
顯示於:光電與材料科技學系

顯示文件完整紀錄

Page view(s)

141
上周
0
上個月
0
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋