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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/15958
DC FieldValueLanguage
dc.contributor.authorHai-Pang Chiangen_US
dc.contributor.authorJing-Lun Linen_US
dc.contributor.authorRailing Changen_US
dc.contributor.authorZhi-Wei Chenen_US
dc.contributor.authorPui Tak Leungen_US
dc.date.accessioned2021-02-24T05:32:36Z-
dc.date.available2021-02-24T05:32:36Z-
dc.date.issued2005-11-10-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/15958-
dc.description.abstractWe have recently demonstrated that ultra high resolution of angular measurement down to 10-6 degree can be achieved via surface-plasmon-resonance heterodyne interferometry, in which the phase difference between p- and s- polarized reflected waves is monitored as a function of the incident angle. Here we give a brief summary of this technique and the rationale based on which such a measurement is possible. As a further study, we have also investigated, via simulation, how the change in environmental temperature will affect the resolution limit of this very versatile technique.en_US
dc.language.isoenen_US
dc.publisherSociety of Photo-Optical Instrumentation Engineers (SPIE)en_US
dc.relation.ispartofNanofabrication: Technologies, Devices, and Applications IIen_US
dc.titleHigh resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengthsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1117/12.630594-
dc.relation.journalvolume6002en_US
dc.relation.pages600218en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.orcid0000-0003-0752-175X-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:光電與材料科技學系
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